12,778 research outputs found

    On A Simpler and Faster Derivation of Single Use Reliability Mean and Variance for Model-Based Statistical Testing

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    Markov chain usage-based statistical testing has proved sound and effective in providing audit trails of evidence in certifying software-intensive systems. The system end-toend reliability is derived analytically in closed form, following an arc-based Bayesian model. System reliability is represented by an important statistic called single use reliability, and defined as the probability of a randomly selected use being successful. This paper continues our earlier work on a simpler and faster derivation of the single use reliability mean, and proposes a new derivation of the single use reliability variance by applying a well-known theorem and eliminating the need to compute the second moments of arc failure probabilities. Our new results complete a new analysis that could be shown to be simpler, faster, and more direct while also rendering a more intuitive explanation. Our new theory is illustrated with three simple Markov chain usage models with manual derivations and experimental results

    Investigation of Downey model for speedup prediction

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    In parallel computing, accurate prediction of speedup is important for job schedulers with adaptive resource allocation. The predicted speedup determines the expected runtime on a certain number of nodes and the efficiency by which the resources are used. Among the existing speedup prediction models, the Downey model [5, 6] is simple but promising. However, the prediction accuracy of the Downey model needs to be investigated in realistic scenario setups. In this thesis, we use the NAS benchmarks and synthetic benchmarks [19] to generate scenarios in which the performance of the Downey model is examined. Based on these experiments, conditions are suggested for the successful application of the Downey model
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